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author | Johan Hovold <jhovold@gmail.com> | 2013-03-21 12:36:32 +0100 |
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committer | Greg Kroah-Hartman <gregkh@linuxfoundation.org> | 2013-03-25 13:44:17 -0700 |
commit | 80dfe0ceb31d92aca835d94f0255d93288e5ed12 (patch) | |
tree | 4a2d1ad2f217cf004f770e437a1d832122f541ef /drivers/usb/storage/debug.c | |
parent | 853127faa43f4971c4e9fc506bb86622208ca935 (diff) | |
download | linux-80dfe0ceb31d92aca835d94f0255d93288e5ed12.tar.bz2 |
USB: keyspan: remove bogus disconnect test in close
Remove bogus (and unnecessary) test for serial->dev being NULL in close.
The device is never cleared, and close is never called after a completed
disconnect anyway.
Remove some out-commented bogus code while at it.
Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
Diffstat (limited to 'drivers/usb/storage/debug.c')
0 files changed, 0 insertions, 0 deletions