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authorSylwester Nawrocki <s.nawrocki@samsung.com>2013-03-14 07:01:24 -0300
committerMauro Carvalho Chehab <mchehab@redhat.com>2013-03-31 10:55:19 -0300
commitfc39f46b54b600f053bf9bab757023344e97925e (patch)
tree43c702bd3b9f5d6765a0f67c5f03ec3ae2d57a41 /Documentation/DocBook
parent4163851f7b997e24602cad8e0eae96d31a252548 (diff)
downloadlinux-fc39f46b54b600f053bf9bab757023344e97925e.tar.bz2
[media] V4L: Add MATRIX option to V4L2_CID_EXPOSURE_METERING control
This patch adds a menu option to the V4L2_CID_EXPOSURE_METERING control for multi-zone metering. Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com> Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
Diffstat (limited to 'Documentation/DocBook')
-rw-r--r--Documentation/DocBook/media/v4l/controls.xml7
1 files changed, 7 insertions, 0 deletions
diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
index c8eb6c222274..8d7a77928d49 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -3142,6 +3142,13 @@ giving priority to the center of the metered area.</entry>
<entry><constant>V4L2_EXPOSURE_METERING_SPOT</constant>&nbsp;</entry>
<entry>Measure only very small area at the center of the frame.</entry>
</row>
+ <row>
+ <entry><constant>V4L2_EXPOSURE_METERING_MATRIX</constant>&nbsp;</entry>
+ <entry>A multi-zone metering. The light intensity is measured
+in several points of the frame and the the results are combined. The
+algorithm of the zones selection and their significance in calculating the
+final value is device dependant.</entry>
+ </row>
</tbody>
</entrytbl>
</row>