diff options
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
-rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 125 |
1 files changed, 43 insertions, 82 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 6f98b6a9b785..6ad47a67521c 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -455,6 +455,19 @@ Contact: linux-iio@vger.kernel.org Description: Hardware applied calibration offset (assumed to fix production inaccuracies). + icm42600: For this device values are real physical offsets + expressed in SI units (m/s^2 for accelerometers and rad/s + for gyroscope)/ + +What: /sys/bus/iio/devices/iio:deviceX/in_accel_calibbias_available +What: /sys/bus/iio/devices/iio:deviceX/in_anglvel_calibbias_available +KernelVersion: 5.8 +Contact: linux-iio@vger.kernel.org +Description: + Available values of calibbias. Maybe expressed as either of: + + - a small discrete set of values like "0 2 4 6 8" + - a range specified as "[min step max]" What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_calibscale What: /sys/bus/iio/devices/iio:deviceX/in_voltageY_supply_calibscale @@ -652,6 +665,25 @@ Description: Output frequency for channel Y in Hz. The number must always be specified and unique if the output corresponds to a single channel. + Some drivers have additional constraints: + ADF4371 has an integrated VCO with fundamendal output + frequency ranging from 4000000000 Hz 8000000000 Hz. + + out_altvoltage0_frequency: + A divide by 1, 2, 4, 8, 16, 32 or circuit generates + frequencies from 62500000 Hz to 8000000000 Hz. + out_altvoltage1_frequency: + This channel duplicates the channel 0 frequency + out_altvoltage2_frequency: + A frequency doubler generates frequencies from + 8000000000 Hz to 16000000000 Hz. + out_altvoltage3_frequency: + A frequency quadrupler generates frequencies from + 16000000000 Hz to 32000000000 Hz. + + Note: writes to one of the channels will affect the frequency of + all the other channels, since it involves changing the VCO + fundamental output frequency. What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_phase KernelVersion: 3.4.0 @@ -663,6 +695,17 @@ Description: specified and unique if the output corresponds to a single channel. +What: /sys/bus/iio/devices/iio:deviceX/out_currentY_raw +Date: May 2012 +KernelVersion: 3.5 +Contact: Johan Hovold <jhovold@gmail.com> +Description: + Set/get output current for channel Y. Units after application + of scale and offset are milliamps. + For some devices current channels are used to specify + current supplied to elements used in taking a measurement + of a different type. E.g. LED currents. + What: /sys/bus/iio/devices/iio:deviceX/events KernelVersion: 2.6.35 Contact: linux-iio@vger.kernel.org @@ -1195,16 +1238,12 @@ Description: The name of the trigger source being used, as per string given in /sys/class/iio/triggerY/name. -What: /sys/bus/iio/devices/iio:deviceX/buffer/length -KernelVersion: 2.6.35 What: /sys/bus/iio/devices/iio:deviceX/bufferY/length KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org Description: Number of scans contained by the buffer. -What: /sys/bus/iio/devices/iio:deviceX/buffer/enable -KernelVersion: 2.6.35 What: /sys/bus/iio/devices/iio:deviceX/bufferY/enable KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org @@ -1212,8 +1251,6 @@ Description: Actually start the buffer capture up. Will start trigger if first device and appropriate. -What: /sys/bus/iio/devices/iio:deviceX/scan_elements -KernelVersion: 2.6.37 What: /sys/bus/iio/devices/iio:deviceX/bufferY KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org @@ -1224,34 +1261,6 @@ Description: Since kernel 5.11 the scan_elements attributes are merged into the bufferY directory, to be configurable per buffer. -What: /sys/.../iio:deviceX/scan_elements/in_accel_x_en -What: /sys/.../iio:deviceX/scan_elements/in_accel_y_en -What: /sys/.../iio:deviceX/scan_elements/in_accel_z_en -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_en -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_en -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_en -What: /sys/.../iio:deviceX/scan_elements/in_magn_x_en -What: /sys/.../iio:deviceX/scan_elements/in_magn_y_en -What: /sys/.../iio:deviceX/scan_elements/in_magn_z_en -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_en -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_en -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_tilt_comp_en -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_tilt_comp_en -What: /sys/.../iio:deviceX/scan_elements/in_timestamp_en -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_en -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_en -What: /sys/.../iio:deviceX/scan_elements/in_voltageY-voltageZ_en -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_i_en -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_q_en -What: /sys/.../iio:deviceX/scan_elements/in_voltage_i_en -What: /sys/.../iio:deviceX/scan_elements/in_voltage_q_en -What: /sys/.../iio:deviceX/scan_elements/in_incli_x_en -What: /sys/.../iio:deviceX/scan_elements/in_incli_y_en -What: /sys/.../iio:deviceX/scan_elements/in_pressureY_en -What: /sys/.../iio:deviceX/scan_elements/in_pressure_en -What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_en -What: /sys/.../iio:deviceX/scan_elements/in_proximity_en -KernelVersion: 2.6.37 What: /sys/.../iio:deviceX/bufferY/in_accel_x_en What: /sys/.../iio:deviceX/bufferY/in_accel_y_en What: /sys/.../iio:deviceX/bufferY/in_accel_z_en @@ -1284,23 +1293,6 @@ Contact: linux-iio@vger.kernel.org Description: Scan element control for triggered data capture. -What: /sys/.../iio:deviceX/scan_elements/in_accel_type -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_type -What: /sys/.../iio:deviceX/scan_elements/in_magn_type -What: /sys/.../iio:deviceX/scan_elements/in_incli_type -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_type -What: /sys/.../iio:deviceX/scan_elements/in_voltage_type -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_type -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_i_type -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_q_type -What: /sys/.../iio:deviceX/scan_elements/in_voltage_i_type -What: /sys/.../iio:deviceX/scan_elements/in_voltage_q_type -What: /sys/.../iio:deviceX/scan_elements/in_timestamp_type -What: /sys/.../iio:deviceX/scan_elements/in_pressureY_type -What: /sys/.../iio:deviceX/scan_elements/in_pressure_type -What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_type -What: /sys/.../iio:deviceX/scan_elements/in_proximity_type -KernelVersion: 2.6.37 What: /sys/.../iio:deviceX/bufferY/in_accel_type What: /sys/.../iio:deviceX/bufferY/in_anglvel_type What: /sys/.../iio:deviceX/bufferY/in_magn_type @@ -1347,33 +1339,6 @@ Description: If the type parameter can take one of a small set of values, this attribute lists them. -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_index -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_index -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_i_index -What: /sys/.../iio:deviceX/scan_elements/in_voltageY_q_index -What: /sys/.../iio:deviceX/scan_elements/in_voltage_i_index -What: /sys/.../iio:deviceX/scan_elements/in_voltage_q_index -What: /sys/.../iio:deviceX/scan_elements/in_accel_x_index -What: /sys/.../iio:deviceX/scan_elements/in_accel_y_index -What: /sys/.../iio:deviceX/scan_elements/in_accel_z_index -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_index -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_index -What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_index -What: /sys/.../iio:deviceX/scan_elements/in_magn_x_index -What: /sys/.../iio:deviceX/scan_elements/in_magn_y_index -What: /sys/.../iio:deviceX/scan_elements/in_magn_z_index -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_index -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_index -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_magnetic_tilt_comp_index -What: /sys/.../iio:deviceX/scan_elements/in_rot_from_north_true_tilt_comp_index -What: /sys/.../iio:deviceX/scan_elements/in_incli_x_index -What: /sys/.../iio:deviceX/scan_elements/in_incli_y_index -What: /sys/.../iio:deviceX/scan_elements/in_timestamp_index -What: /sys/.../iio:deviceX/scan_elements/in_pressureY_index -What: /sys/.../iio:deviceX/scan_elements/in_pressure_index -What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_index -What: /sys/.../iio:deviceX/scan_elements/in_proximity_index -KernelVersion: 2.6.37 What: /sys/.../iio:deviceX/bufferY/in_voltageY_index What: /sys/.../iio:deviceX/bufferY/in_voltageY_supply_index What: /sys/.../iio:deviceX/bufferY/in_voltageY_i_index @@ -1613,8 +1578,6 @@ Description: Specifies number of seconds in which we compute the steps that occur in order to decide if the consumer is making steps. -What: /sys/bus/iio/devices/iio:deviceX/buffer/watermark -KernelVersion: 4.2 What: /sys/bus/iio/devices/iio:deviceX/bufferY/watermark KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org @@ -1633,8 +1596,6 @@ Description: the available samples after the timeout expires and thus have a maximum delay guarantee. -What: /sys/bus/iio/devices/iio:deviceX/buffer/data_available -KernelVersion: 4.16 What: /sys/bus/iio/devices/iio:deviceX/bufferY/data_available KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org |