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authorLinus Torvalds <torvalds@linux-foundation.org>2013-09-09 10:33:19 -0700
committerLinus Torvalds <torvalds@linux-foundation.org>2013-09-09 10:33:19 -0700
commitef9a61bef917e38f8e096f6df303329aed6cf467 (patch)
tree31cfe2444d0270e77ff8ef792df11591fed6075c /Documentation/ABI
parentb5f0998cae3d7ea56d3d8377e46328fe972b9546 (diff)
parent6c3b88970175e18a67eb8e55c4eba10614d0d5dc (diff)
downloadlinux-ef9a61bef917e38f8e096f6df303329aed6cf467.tar.bz2
Merge tag 'for-linus-20130909' of git://git.infradead.org/linux-mtd
Pull mtd updates from David Woodhouse: - factor out common code from MTD tests - nand-gpio cleanup and portability to non-ARM - m25p80 support for 4-byte addressing chips, other new chips - pxa3xx cleanup and support for new platforms - remove obsolete alauda, octagon-5066 drivers - erase/write support for bcm47xxsflash - improve detection of ECC requirements for NAND, controller setup - NFC acceleration support for atmel-nand, read/write via SRAM - etc * tag 'for-linus-20130909' of git://git.infradead.org/linux-mtd: (184 commits) mtd: chips: Add support for PMC SPI Flash chips in m25p80.c mtd: ofpart: use for_each_child_of_node() macro mtd: mtdswap: replace strict_strtoul() with kstrtoul() mtd cs553x_nand: use kzalloc() instead of memset mtd: atmel_nand: fix error return code in atmel_nand_probe() mtd: bcm47xxsflash: writing support mtd: bcm47xxsflash: implement erasing support mtd: bcm47xxsflash: convert to module_platform_driver instead of init/exit mtd: bcm47xxsflash: convert kzalloc to avoid invalid access mtd: remove alauda driver mtd: nand: mxc_nand: mark 'const' properly mtd: maps: cfi_flagadm: add missing __iomem annotation mtd: spear_smi: add missing __iomem annotation mtd: r852: Staticize local symbols mtd: nandsim: Staticize local symbols mtd: impa7: add missing __iomem annotation mtd: sm_ftl: Staticize local symbols mtd: m25p80: add support for mr25h10 mtd: m25p80: make CONFIG_M25PXX_USE_FAST_READ safe to enable mtd: m25p80: Pass flags through CAT25_INFO macro ...
Diffstat (limited to 'Documentation/ABI')
-rw-r--r--Documentation/ABI/testing/sysfs-class-mtd17
1 files changed, 14 insertions, 3 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644b3bfc..bfd119ace6ad 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -128,9 +128,8 @@ KernelVersion: 3.4
Contact: linux-mtd@lists.infradead.org
Description:
Maximum number of bit errors that the device is capable of
- correcting within each region covering an ecc step. This will
- always be a non-negative integer. Note that some devices will
- have multiple ecc steps within each writesize region.
+ correcting within each region covering an ECC step (see
+ ecc_step_size). This will always be a non-negative integer.
In the case of devices lacking any ECC capability, it is 0.
@@ -173,3 +172,15 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+
+What: /sys/class/mtd/mtdX/ecc_step_size
+Date: May 2013
+KernelVersion: 3.10
+Contact: linux-mtd@lists.infradead.org
+Description:
+ The size of a single region covered by ECC, known as the ECC
+ step. Devices may have several equally sized ECC steps within
+ each writesize region.
+
+ It will always be a non-negative integer. In the case of
+ devices lacking any ECC capability, it is 0.