From 0ead11181fe0c9538b185e46a494df21dc7de23a Mon Sep 17 00:00:00 2001 From: Dan Williams Date: Wed, 26 Sep 2018 10:47:15 -0700 Subject: acpi, nfit: Collect shutdown status Some NVDIMMs, in addition to providing an indication of whether the previous shutdown was clean, also provide a running count of lifetime dirty-shutdown events for the device. In anticipation of this functionality appearing on more devices arrange for the nfit driver to retrieve / cache this data at DIMM discovery time, and export it via sysfs. Reviewed-by: Keith Busch Signed-off-by: Dan Williams --- tools/testing/nvdimm/test/nfit.c | 1 + tools/testing/nvdimm/test/nfit_test.h | 24 ------------------------ 2 files changed, 1 insertion(+), 24 deletions(-) (limited to 'tools') diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c index cffc2c5a778d..f1a2a1a7bb1b 100644 --- a/tools/testing/nvdimm/test/nfit.c +++ b/tools/testing/nvdimm/test/nfit.c @@ -24,6 +24,7 @@ #include #include #include +#include #include #include #include "nfit_test.h" diff --git a/tools/testing/nvdimm/test/nfit_test.h b/tools/testing/nvdimm/test/nfit_test.h index 33752e06ff8d..ade14fe3837e 100644 --- a/tools/testing/nvdimm/test/nfit_test.h +++ b/tools/testing/nvdimm/test/nfit_test.h @@ -117,30 +117,6 @@ struct nd_cmd_ars_err_inj_stat { #define ND_INTEL_SMART_INJECT_FATAL (1 << 2) #define ND_INTEL_SMART_INJECT_SHUTDOWN (1 << 3) -struct nd_intel_smart { - __u32 status; - union { - struct { - __u32 flags; - __u8 reserved0[4]; - __u8 health; - __u8 spares; - __u8 life_used; - __u8 alarm_flags; - __u16 media_temperature; - __u16 ctrl_temperature; - __u32 shutdown_count; - __u8 ait_status; - __u16 pmic_temperature; - __u8 reserved1[8]; - __u8 shutdown_state; - __u32 vendor_size; - __u8 vendor_data[92]; - } __packed; - __u8 data[128]; - }; -} __packed; - struct nd_intel_smart_threshold { __u32 status; union { -- cgit v1.2.3 From f110176633d74bbac1f80ab9b9c6b83ea3e1cc23 Mon Sep 17 00:00:00 2001 From: Dan Williams Date: Wed, 17 Oct 2018 10:47:19 -0700 Subject: tools/testing/nvdimm: Populate dirty shutdown data Allow the unit tests to verify the retrieval of the dirty shutdown count via smart commands, and allow the driver-load-time retrieval of the smart health payload to be simulated by nfit_test. Reviewed-by: Keith Busch Signed-off-by: Dan Williams --- drivers/acpi/nfit/core.c | 7 +++++-- tools/testing/nvdimm/Kbuild | 1 + tools/testing/nvdimm/acpi_nfit_test.c | 8 ++++++++ tools/testing/nvdimm/test/nfit.c | 3 ++- 4 files changed, 16 insertions(+), 3 deletions(-) (limited to 'tools') diff --git a/drivers/acpi/nfit/core.c b/drivers/acpi/nfit/core.c index bf7021bb276c..ec8fb578fa36 100644 --- a/drivers/acpi/nfit/core.c +++ b/drivers/acpi/nfit/core.c @@ -1721,7 +1721,7 @@ static bool acpi_nvdimm_has_method(struct acpi_device *adev, char *method) return false; } -static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem) +__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem) { struct nd_intel_smart smart = { 0 }; union acpi_object in_buf = { @@ -1785,8 +1785,11 @@ static int acpi_nfit_add_dimm(struct acpi_nfit_desc *acpi_desc, nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en; nfit_mem->family = NVDIMM_FAMILY_INTEL; adev = to_acpi_dev(acpi_desc); - if (!adev) + if (!adev) { + /* unit test case */ + populate_shutdown_status(nfit_mem); return 0; + } adev_dimm = acpi_find_child_device(adev, device_handle, false); nfit_mem->adev = adev_dimm; diff --git a/tools/testing/nvdimm/Kbuild b/tools/testing/nvdimm/Kbuild index 0392153a0009..778ceb651000 100644 --- a/tools/testing/nvdimm/Kbuild +++ b/tools/testing/nvdimm/Kbuild @@ -22,6 +22,7 @@ NVDIMM_SRC := $(DRIVERS)/nvdimm ACPI_SRC := $(DRIVERS)/acpi/nfit DAX_SRC := $(DRIVERS)/dax ccflags-y := -I$(src)/$(NVDIMM_SRC)/ +ccflags-y += -I$(src)/$(ACPI_SRC)/ obj-$(CONFIG_LIBNVDIMM) += libnvdimm.o obj-$(CONFIG_BLK_DEV_PMEM) += nd_pmem.o diff --git a/tools/testing/nvdimm/acpi_nfit_test.c b/tools/testing/nvdimm/acpi_nfit_test.c index 43521512e577..fec8fb1b7715 100644 --- a/tools/testing/nvdimm/acpi_nfit_test.c +++ b/tools/testing/nvdimm/acpi_nfit_test.c @@ -4,5 +4,13 @@ #include #include #include "watermark.h" +#include nfit_test_watermark(acpi_nfit); + +/* strong / override definition of nfit_intel_shutdown_status */ +void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem) +{ + set_bit(NFIT_MEM_DIRTY_COUNT, &nfit_mem->flags); + nfit_mem->dirty_shutdown = 42; +} diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c index f1a2a1a7bb1b..9527d47a1070 100644 --- a/tools/testing/nvdimm/test/nfit.c +++ b/tools/testing/nvdimm/test/nfit.c @@ -149,6 +149,7 @@ static const struct nd_intel_smart smart_def = { | ND_INTEL_SMART_ALARM_VALID | ND_INTEL_SMART_USED_VALID | ND_INTEL_SMART_SHUTDOWN_VALID + | ND_INTEL_SMART_SHUTDOWN_COUNT_VALID | ND_INTEL_SMART_MTEMP_VALID | ND_INTEL_SMART_CTEMP_VALID, .health = ND_INTEL_SMART_NON_CRITICAL_HEALTH, @@ -161,8 +162,8 @@ static const struct nd_intel_smart smart_def = { .ait_status = 1, .life_used = 5, .shutdown_state = 0, + .shutdown_count = 42, .vendor_size = 0, - .shutdown_count = 100, }; struct nfit_test_fw { -- cgit v1.2.3